Fumio Hosokawa
Kunitachi, 1860001, Japan
Last Updated: 09/26/2026
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Found 13 publications
Semicircular-aperture illumination scanning transmission electron microscopy.
Journal: Ultramicroscopy
Published: October 09, 2024
Evaluation of automated particle picking for cryogenic electron microscopy using high-precision transmission electron microscope simulation based on a multi-slice method.
Journal: Acta crystallographica. Section D, Structural biology
Published: November 06, 2020
Evaluation of residual aberration in fifth-order geometrical aberration correctors.
Journal: Microscopy (Oxford, England)
Published: September 12, 2017
Image transfer with spatial coherence for aberration corrected transmission electron microscopes.
Journal: Ultramicroscopy
Published: January 29, 2016
Benchmark test of accelerated multi-slice simulation by GPGPU.
Journal: Ultramicroscopy
Published: March 18, 2015
Atomic-Resolution STEM Imaging of Graphene at Low Voltage of 30 kV with Resolution Enhancement by Using Large Convergence Angle.
Journal: Physical review letters
Published: October 24, 2014
Phase-contrast scanning transmission electron microscopy.
Journal: Microscopy (Oxford, England)
Published: October 17, 2014
Resolving 45-pm-separated Si-Si atomic columns with an aberration-corrected STEM.
Journal: Microscopy (Oxford, England)
Published: October 14, 2014
Multi-pore carbon phase plate for phase-contrast transmission electron microscopy.
Journal: Ultramicroscopy
Published: March 20, 2014
Resolution enhancement at a large convergence angle by a delta corrector with a CFEG in a low-accelerating-voltage STEM.
Journal: Micron (Oxford, England : 1993)
Published: September 01, 2013
Development of Cs and Cc correctors for transmission electron microscopy.
Journal: Microscopy (Oxford, England)
Published: February 08, 2013
Last Updated: 09/26/2026