Knut Muller - Publications

Health-related quality of life in double-blind Phase III studies of brivaracetam as adjunctive therapy of focal seizures: A pooled, post-hoc analysis.

Journal: Epilepsy & behavior : E&B

Published: September 09, 2016

PatientsLikeMe® Online Epilepsy Community: Patient characteristics and predictors of poor health-related quality of life.

Journal: Epilepsy & behavior : E&B

Published: May 06, 2016

Simultaneous quantification of indium and nitrogen concentration in InGaNAs using HAADF-STEM.

Journal: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

Published: October 01, 2014

Influence of static atomic displacements on composition quantification of AlGaN/GaN heterostructures from HAADF-STEM images.

Journal: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

Published: July 11, 2014

Conventional transmission electron microscopy imaging beyond the diffraction and information limits.

Journal: Physical review letters

Published: March 28, 2014

Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction.

Journal: Nature communications

Published: February 06, 2014

Coherently embedded Ag nanostructures in Si: 3D imaging and their application to SERS.

Journal: Scientific reports

Published: October 30, 2013

Synthesis and functionalisation of magnetic nanoparticles for hyperthermia applications.

Journal: International journal of hyperthermia : the official journal of European Society for Hyperthermic Oncology, North American Hyperthermia Group

Published: October 09, 2013

Comparison of intensity and absolute contrast of simulated and experimental high-resolution transmission electron microscopy images for different multislice simulation methods.

Journal: Ultramicroscopy

Published: March 22, 2013

Measurement of indium concentration profiles and segregation efficiencies from high-angle annular dark field-scanning transmission electron microscopy images.

Journal: Ultramicroscopy

Published: December 17, 2012

Strain measurement in semiconductor heterostructures by scanning transmission electron microscopy.

Journal: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

Published: October 03, 2012

Quantitative chemical evaluation of dilute GaNAs using ADF STEM: avoiding surface strain induced artifacts.

Journal: Ultramicroscopy

Published: July 26, 2012