Pieter J. Kruit
Delft, ZH 2628CJ, Netherlands
Last Updated: 09/26/2026
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Found 37 publications
Sidewall angle tuning in focused electron beam-induced processing.
Journal: Beilstein journal of nanotechnology
Published: January 15, 2024
A new approach for fast field calculation in electrostatic electron lens design and optimization.
Journal: Scientific reports
Published: August 11, 2023
Imaging resonant micro-cantilever movement with ultrafast scanning electron microscopy.
Journal: The Review of scientific instruments
Published: October 01, 2022
In multi electron beam systems, "Neighbours Matter".
Journal: Ultramicroscopy
Published: June 14, 2022
Principles of electron wave front modulation with two miniature electron mirrors.
Journal: Ultramicroscopy
Published: July 28, 2021
Interaction-Free Measurement with Electrons.
Journal: Physical review letters
Published: January 14, 2021
Electrostatic electron mirror in SEM for simultaneous imaging of top and bottom surfaces of a sample.
Journal: Ultramicroscopy
Published: December 22, 2020
Combined Focused Electron Beam-Induced Deposition and Etching for the Patterning of Dense Lines without Interconnecting Material.
Journal: Micromachines
Published: November 30, 2020
Trajectory displacement in a multi beam scanning electron microscope.
Journal: Ultramicroscopy
Published: October 20, 2020
Quality of vision and vision-related quality of life after Descemet membrane endothelial keratoplasty: a randomized clinical trial.
Journal: Acta ophthalmologica
Published: October 15, 2020
Lock-in Ultrafast Electron Microscopy Simultaneously Visualizes Carrier Recombination and Interface-Mediated Trapping.
Journal: The journal of physical chemistry letters
Published: September 10, 2020
Last Updated: 09/26/2026